Paper
22 August 1988 Picosecond Single-Photon-Counting Spectroscopy Of Cd1-xZnxTe AND Cd1-xMnxTe-CdTe
S. Perkowitz, S. S. Yom
Author Affiliations +
Proceedings Volume 0942, Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors II; (1988) https://doi.org/10.1117/12.947222
Event: Advances in Semiconductors and Superconductors: Physics and Device Applications, 1988, Newport Beach, CA, United States
Abstract
Time correlated single-photon-counting is a high-sensitivity high-resolution spectroscopic method for picosecond photoluminescence which we apply to two important II-VI semiconductors. In crystalline bulk Cd1-xZnxTe we measure lifetimes of impurity-bound excitons and relate them to theory. In Cd1-xMnx-CdTe superlattices we measure lifetimes of confined excitons decreasing with well thickness, which we relate to two-dimensional behavior, and find lifetimes possibly associated with subband energies.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Perkowitz and S. S. Yom "Picosecond Single-Photon-Counting Spectroscopy Of Cd1-xZnxTe AND Cd1-xMnxTe-CdTe", Proc. SPIE 0942, Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors II, (22 August 1988); https://doi.org/10.1117/12.947222
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KEYWORDS
Excitons

Picosecond phenomena

Stereolithography

Roentgenium

Semiconductors

Spectroscopy

Laser beam diagnostics

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