18 August 1988 Measurement Of Refractive Indices By Grating Coupling
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Proceedings Volume 0943, Quantum Well and Superlattice Physics II; (1988) https://doi.org/10.1117/12.947321
Event: Advances in Semiconductors and Superconductors: Physics and Device Applications, 1988, Newport Beach, CA, United States
Abstract
We present the results of measurements, by means of a grating coupling method, of the index of refraction of several bulk materials and of slab waveguides of the GaAs/AlGaAs system. Preliminary results show good agreement with literature values obtained by other methods.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. G. Kaufman, R. G. Kaufman, A. L. Moretti, A. L. Moretti, D. J. Vezzetti, D. J. Vezzetti, F. A. Chambers, F. A. Chambers, R. Wickman, R. Wickman, } "Measurement Of Refractive Indices By Grating Coupling", Proc. SPIE 0943, Quantum Well and Superlattice Physics II, (18 August 1988); doi: 10.1117/12.947321; https://doi.org/10.1117/12.947321
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