9 August 1988 Algorithm For LI Near Gradient Refractive Indices
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Proceedings Volume 0946, Spectroscopic Characterization Techniques for Semiconductor Technology III; (1988) https://doi.org/10.1117/12.947420
Event: Advances in Semiconductors and Superconductors: Physics and Device Applications, 1988, Newport Beach, CA, United States
Abstract
Electronic and optical materials can and are being fabricated in a variety of forms including monotonic variation of their physical properties. A characteristic matrix for translating the optical parameters in media having linear gradients In complex refractive indices Is the basis for an algorithm for a program to calculate optical parameters for ellipsometry, reflectance and transmittance. Illustrative examples are given for three different types of gradient systems such as might be encountered in opto-electronic applications.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roy F. Potter, Roy F. Potter, } "Algorithm For LI Near Gradient Refractive Indices", Proc. SPIE 0946, Spectroscopic Characterization Techniques for Semiconductor Technology III, (9 August 1988); doi: 10.1117/12.947420; https://doi.org/10.1117/12.947420
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