Paper
8 September 1988 Nonlinear Optoelectronic Effects In Ultrafast Photoconductive Switches
Duane D. Smith, John F. Knudsen, Steven C. Moss
Author Affiliations +
Proceedings Volume 0947, Interconnection of High Speed and High Frequency Devices and Systems; (1988) https://doi.org/10.1117/12.947460
Event: Advances in Semiconductors and Superconductors: Physics and Device Applications, 1988, Newport Beach, CA, United States
Abstract
Ultrafast photoconductive switches have been used to generate electrical waveforms and to sample both electrical and optical waveforms. Widespread use of these switches is anticipated in conjunction with optical interconnects. We present results of an investigation into the electrical bias dependence and optical intensity dependence of the responsivity of photoconductive switches. The switches were fabricated using standard 50 0 microstrip transmission line technology on silicon-on-sapphire wafers. Ultrafast photoconductive response was produced by ion-implanting the silicon to reduce the carrier lifetime. We find that the performance of the switches is critically dependent upon wafer fabrication and ion-implantation conditions. While all of the switches tested possessed picosecond-scale response, the linearity of response with electrical bias and optical intensity was dependent on the order of the metalization and ion-implantation processing steps. In contrast to reports in the literature, fabrication processes which were expected to yield switches with ohmic contacts instead yielded switches with nonlinear response. We discuss the contributions of nonlinear absorption, carrier transport, charge screening and the build-up of space charge as well as other geometrical effects.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Duane D. Smith, John F. Knudsen, and Steven C. Moss "Nonlinear Optoelectronic Effects In Ultrafast Photoconductive Switches", Proc. SPIE 0947, Interconnection of High Speed and High Frequency Devices and Systems, (8 September 1988); https://doi.org/10.1117/12.947460
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Switches

Semiconducting wafers

Silicon

Ultrafast phenomena

Optoelectronics

Interfaces

Wafer-level optics

Back to Top