Overview Of Optical Methods In Metrology

Jean Ebbeni

doi:10.1117/12.968814

16 January 1988 Overview Of Optical Methods In Metrology

Jean Ebbeni

Proceedings Volume 0952, Laser Technologies in Industry; (1988) https://doi.org/10.1117/12.968814
Event: Laser Technologies in Industry, 1988, Porto, Portugal

Abstract

The aim of this paper is not to give a long and tedious description of all the optical methods used in metrology, but to draw some general specific propertters and ideas illustrated by representative applications. Impact of non-linear optics, optical waveguides and holographic optical elements are selected fields for this review.

Citation Download Citation

Jean Ebbeni "Overview Of Optical Methods In Metrology", Proc. SPIE 0952, Laser Technologies in Industry, (16 January 1988); https://doi.org/10.1117/12.968814

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