Some New Techniques With Digital Speckle Pattern Interferometry (DSPI)

R. S. Sirohi; A. R. Ganesan; M. P. Kothiyal

doi:10.1117/12.968836

16 January 1988 Some New Techniques With Digital Speckle Pattern Interferometry (DSPI)

R. S. Sirohi, A. R. Ganesan, M. P. Kothiyal

Proceedings Volume 0952, Laser Technologies in Industry; (1988) https://doi.org/10.1117/12.968836
Event: Laser Technologies in Industry, 1988, Porto, Portugal

Abstract

Digital Speckle Pattern Interferometry (DSPI) is presented as a real-time technique for a number of applications such as measurement of small displacements, displacement derivatives, contouring, and non-destructive testing. The implementation of DSPI on a commercially available image processing system is described. A method of fringe sharpening in DSPI is also presented.

Citation Download Citation

R. S. Sirohi, A. R. Ganesan, and M. P. Kothiyal "Some New Techniques With Digital Speckle Pattern Interferometry (DSPI)", Proc. SPIE 0952, Laser Technologies in Industry, (16 January 1988); https://doi.org/10.1117/12.968836

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