16 January 1989 A Fast Deformation Analysis Method By Digital Correlation Technique
Author Affiliations +
Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947607
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
Auto-correlation and cross-correlation methods have been proposed for the detecting of point information in digital speckle pattern photography(DSPP). With the spatial auto-correlation the magnitude and the direction of the deformation can be obtained and with the spatial cross-correlation the deformation vector can be known. The principles of the two methods have been presented and the analytic expressions of the signal have been derived, from which the measurable minimum and maximum have been predicted. The two methods have been implemented on an IBM-PC/XT based image processing system in the author's work and the experiment results have been shown in this paper.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qiang Fang, Qiang Fang, Hong Yiao, Hong Yiao, Yushan Tan, Yushan Tan, Chungshien Ku, Chungshien Ku, } "A Fast Deformation Analysis Method By Digital Correlation Technique", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947607; https://doi.org/10.1117/12.947607

Back to Top