16 January 1989 Computer Moire© Deflectometry Using Talbot Effect
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Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947583
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
Abstract
Computer moire deflectometry (CMD) using onegrating, a TV camera and a computer image processor (CIP) was developed. The TV camera is located in a Talbot plane allowing the recording of a (disturbed) image of the grating with maximum contrast and without any other optical component. CIP is used for obtaining, processing, as well as automated interpretation of the fringes. Double exposure, real-time , time-average and phase-measuring methods of CMD for transparent and reflective objects are equally demonstrated.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. I. Vlad, D. Popa, I. Apostol, "Computer Moire© Deflectometry Using Talbot Effect", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947583; https://doi.org/10.1117/12.947583
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