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16 January 1989 Misalignment Tolerances For A Phased Array Imaging System
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Proceedings Volume 0954, Optical Testing and Metrology II; (1989)
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
A technique is presented for calculating the aberrations induced by misalignment of elements of a phased array imaging system. The misalignment-induced aberration function will be derived in terms of a set of five vectors representing small displacements from the aligned position of each element. This aberration function will represent changes in optical path along each ray for the displacement under consideration. Use of this aberration function can then be made to conduct parametric tolerance studies of such phased array systems. The behavior of the optical system can be analyzed for variable location of the image plane and at selected points within it. These studies are difficult to conduct with conventional ray trace programs, as they involve voluminous number crunching and great attention to proper selection of coordinate systems and transformations. We present results which illustrate the precision levels that should be met in the alignment and metrology of phased array imaging systems to be operated at visible wavelengths. These precision levels are challenging but achievable with state-of-the-art technology.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric W. Young and Shelah M. Peters "Misalignment Tolerances For A Phased Array Imaging System", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989);


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