16 January 1989 Quality Control Using Optical Probe Arrays
Author Affiliations +
Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947632
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
Low cost, optical probes, can be combined into an inspection array, and the go/no-go outputs can be analyzed by a high speed programmable logic controller (PLC). The PLC can be remotely addressed to change the desired level of quality control. The PLC can provide on-line data for blow-by-blow statistical process control (SPC).
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert M. Stewart, Robert M. Stewart, } "Quality Control Using Optical Probe Arrays", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947632; https://doi.org/10.1117/12.947632

Back to Top