16 January 1989 Rough Surfaces Classification Using Fourier Transform
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Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947599
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
An optical/digital approach to the classification of rough surfaces is described. The setup consists of a coherent optical system to generate the Fourier irradiance of a rough sample and a digital computer to process data. The sampling of Fourier spectra is achieved with a wedge ring detector. The extraction and measurement of specific statistical parameters of Fourier spectrum are done for two typical mached samples. An analysis of the efficiency of these parameters in roughness classification is also carried out.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Gorecki, C. Gorecki, } "Rough Surfaces Classification Using Fourier Transform", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947599; https://doi.org/10.1117/12.947599


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