16 January 1989 The Analysis Of Precision In Digital Image Metrology
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Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947625
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
The general problem of precise position estimation is analyzed in the context of quantization errors. A formalism referred to as the locales approach to geometric precision is reviewed. A lower bound on position estimation uncertainty due to quantization is discussed. Some simulation results for an optimal position estimation algorithm, referred to as position decoding, are presented. A heuristic development of an image geometric fidelity measure is presented.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. I. Havelock, "The Analysis Of Precision In Digital Image Metrology", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947625; https://doi.org/10.1117/12.947625

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