14 December 1988 Coherent Information Processing Of White Light Speckle Sandwich
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Proceedings Volume 0955, Industrial Laser Interferometry II; (1988) https://doi.org/10.1117/12.947666
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
Abstract
A sandwich technique is presented. Two white light speckle patterns corresponding to the two different loading states of the structure are recorded. Analysis can be carried on in the Fourier transformation optical system as well as the point diffraction optical system. The coherent conditions of the speckle sandwich patterns are derived. The mismatch of the two corresponding speckle patterns can be made use of to introduce the linear photo-carrier with which the sensitivity and accuracy of the white light speckle are improved, meanwhile the measurement scale is enlarged.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chen Shiming, Wang Rupeng, Xu Zhu, "Coherent Information Processing Of White Light Speckle Sandwich", Proc. SPIE 0955, Industrial Laser Interferometry II, (14 December 1988); doi: 10.1117/12.947666; https://doi.org/10.1117/12.947666
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