8 February 1989 Similarity And Invariance In Pattern Recognition
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Proceedings Volume 0960, Real-Time Signal Processing for Industrial Applications; (1989) https://doi.org/10.1117/12.947789
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
Abstract
The arbitrary nature of the concept of similarity is discussed, and its consequences on the exploitation of invariants in pattern recognition. After briefly reviewing the main invariants of interest in automated pattern recognition, methods of achieving invariant pattern recognition are reviewed, with emphasis on the use of matched spatial filters made with Circular harmonic components. The progress in using such filters and their derivatives with sidelobe-rejection capability on images of increasing complexity, from simple binary shapes to complex grey-level objects on highly cluttered backgrounds, is described.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Henri H. Arsenault, Luc Leclerc, Yunlong Sheng, "Similarity And Invariance In Pattern Recognition", Proc. SPIE 0960, Real-Time Signal Processing for Industrial Applications, (8 February 1989); doi: 10.1117/12.947789; https://doi.org/10.1117/12.947789
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