Fringe Analysis For Testing Optical Surfaces

Steve Wong

doi:10.1117/12.948078

29 January 1989 Fringe Analysis For Testing Optical Surfaces

Steve Wong

Proceedings Volume 0966, Advances in Fabrication and Metrology for Optics and Large Optics; (1989) https://doi.org/10.1117/12.948078
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

A general method of analyzing fringe data from interferometric testing of optical surfaces is described. The method combines the surface optimization routine with the lens design software to simulate the optical testing and to reconstruct the testing surface. With this method the residual error requirement on null lens design may be relaxed; some alignment ambiguities can be removed; and the final surface figures and tolerances can be defined. Sources of error are discussed.

Citation Download Citation

Steve Wong "Fringe Analysis For Testing Optical Surfaces", Proc. SPIE 0966, Advances in Fabrication and Metrology for Optics and Large Optics, (29 January 1989); https://doi.org/10.1117/12.948078

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available