Paper
29 January 1989 Surface Profile Error Measurement For Small Rotationally Symmetric Surfaces
Russ Palum
Author Affiliations +
Abstract
The precision machine tool industry has developed processes that produce rotationally symmetric surfaces, both spheres and aspheres, with form errors on the order of 5 microinches (1/5 wave or 0.125 p.m). Precisionmachined diamondturned surfaces can have surface finishes better than 100 angstroms Ra; these surfaces may be intended to be used as an optic, or the surface may be intended to be used to meet a mechanical requirement. Regardless of their intended use, surfaces of this quality can be tested using optical test techniques such as interferometry. This paper reviews the advantages and disadvantages of the methods that have been used to measure aspheric surfaces in the Aspheric Technology department of Kodak Apparatus Division. These techniques include Fizeau and Williams interferometry, holography, stylus and optical profilometry, and null correctors.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Russ Palum "Surface Profile Error Measurement For Small Rotationally Symmetric Surfaces", Proc. SPIE 0966, Advances in Fabrication and Metrology for Optics and Large Optics, (29 January 1989); https://doi.org/10.1117/12.948059
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Aspheric lenses

Interferometers

Wavefronts

Optical spheres

Spherical lenses

Interferometry

Reflectivity

Back to Top