PROCEEDINGS VOLUME 0967
32ND ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 15-18 AUGUST 1988
Stray Light and Contamination in Optical Systems
Editor(s): Robert P. Breault
IN THIS VOLUME

1 Sessions, 34 Papers, 0 Presentations
All Papers  (34)
32ND ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
15-18 August 1988
San Diego, CA, United States
All Papers
Proc. SPIE 0967, Stray Light Technology Overview In 1988, 0000 (5 April 1989); doi: 10.1117/12.948084
Proc. SPIE 0967, A Consistent Theory Of Scatter From Optical Surfaces, 0000 (5 April 1989); doi: 10.1117/12.948085
Proc. SPIE 0967, Dust Removal From Mirrors: Experiments And Analysis Of Adhesion Forces, 0000 (5 April 1989); doi: 10.1117/12.948086
Proc. SPIE 0967, Evidence For Off-Axis Leakage Radiance In High-Altitude Ir Rocketborne Measurements, 0000 (5 April 1989); doi: 10.1117/12.948087
Proc. SPIE 0967, Comparison Of An Iterative Series Solution With Other Approaches Of Scattering Of Electromagnetic Waves By Grating, 0000 (5 April 1989); doi: 10.1117/12.948088
Proc. SPIE 0967, Comparison Of Wavelength Scaling Data To Experiment, 0000 (5 April 1989); doi: 10.1117/12.948089
Proc. SPIE 0967, Maximum And Minimum Limitations Imposed On Bsdf Measurements, 0000 (5 April 1989); doi: 10.1117/12.948090
Proc. SPIE 0967, Predicting Laser Port Scatter, 0000 (5 April 1989); doi: 10.1117/12.948091
Proc. SPIE 0967, Straylight Analysis Of An Aperture Shade Off-Set From The SIRTF Optical Axis, 0000 (5 April 1989); doi: 10.1117/12.948092
Proc. SPIE 0967, Calculation Of Solar Attenuation Coefficient Using Accos V Along A Critical Scattering Path, 0000 (5 April 1989); doi: 10.1117/12.948093
Proc. SPIE 0967, Stray Radiation Measurement On The Infrared Background Signature Survey (IBSS) Telescope, 0000 (5 April 1989); doi: 10.1117/12.948094
Proc. SPIE 0967, Vane Structure Design Trade-Off And Performance Analysis, 0000 (5 April 1989); doi: 10.1117/12.948095
Proc. SPIE 0967, Limitations In A CODE-V To Apart Translator, 0000 (5 April 1989); doi: 10.1117/12.948096
Proc. SPIE 0967, Transfer Of Baffle Data Between Macintosh PC And APART, 0000 (5 April 1989); doi: 10.1117/12.948097
Proc. SPIE 0967, A BRDF Measurement Apparatus For Cryogenically Cooled Samples, 0000 (5 April 1989); doi: 10.1117/12.948098
Proc. SPIE 0967, Cryogenic Scattering Measurements, 0000 (5 April 1989); doi: 10.1117/12.948099
Proc. SPIE 0967, Performance Of A Fully Automated Scatterometer For BRDF And BTDF Measurements At Visible And Infrared Wavelengths, 0000 (5 April 1989); doi: 10.1117/12.948100
Proc. SPIE 0967, Raster Area Scatter Measurements And Sample Uniformity, 0000 (5 April 1989); doi: 10.1117/12.948101
Proc. SPIE 0967, Coherent Heterodyne Scatterometer, 0000 (5 April 1989); doi: 10.1117/12.948102
Proc. SPIE 0967, Design Of A Fully Automated Bidirectional Laser Reflectometer; Application To Emissivity Measurement, 0000 (5 April 1989); doi: 10.1117/12.948103
Proc. SPIE 0967, Laser Scatterometer, 0000 (5 April 1989); doi: 10.1117/12.948104
Proc. SPIE 0967, Separation And Measurement Of Surface Scatter And Volume Scatter From Transparent Optics, 0000 (5 April 1989); doi: 10.1117/12.948105
Proc. SPIE 0967, Panel Discussion: Stray Light And Contamination In Optical Systems, 0000 (5 April 1989); doi: 10.1117/12.948106
Proc. SPIE 0967, BRDF Round Robin, 0000 (5 April 1989); doi: 10.1117/12.948107
Proc. SPIE 0967, BRDF Measurements At 6328 Angstroms And 10.6 Micrometers Of Optical Black Surfaces For Space Telescopes, 0000 (5 April 1989); doi: 10.1117/12.948108
Proc. SPIE 0967, The Reflectance Of Ames 24E, Infrablack, And Martin Black, 0000 (5 April 1989); doi: 10.1117/12.948109
Proc. SPIE 0967, Near Specular Scatter Measurement Techniques For Curved Samples, 0000 (5 April 1989); doi: 10.1117/12.948110
Proc. SPIE 0967, Measurement Of Very Near Specular Scatter, 0000 (5 April 1989); doi: 10.1117/12.948111
Proc. SPIE 0967, A Small-Angle Scatterometer, 0000 (5 April 1989); doi: 10.1117/12.948112
Proc. SPIE 0967, The Effect Of Elevated Temperatures On The Scattering Properties Of An Optical Black Surface At 0.6328 And 10.6 Micrometers, 0000 (5 April 1989); doi: 10.1117/12.948113
Proc. SPIE 0967, Comparison Of The Bidirectional Reflectance Distribution Function Of Various Surfaces, 0000 (5 April 1989); doi: 10.1117/12.948114
Proc. SPIE 0967, Measurement Of Total Hemispherical Emissivity Of Contaminated Mirror Surfaces, 0000 (5 April 1989); doi: 10.1117/12.948115
Proc. SPIE 0967, Particulate Debris From Pulsed Electron Bombardment Of Optical Baffle Materials., 0000 (5 April 1989); doi: 10.1117/12.948116
Proc. SPIE 0967, Front Surface Optic Contamination From Small Rocket Plumes, 0000 (5 April 1989); doi: 10.1117/12.948117
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