5 April 1989 Comparison Of Wavelength Scaling Data To Experiment
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Abstract
Wavelength scaling is the process of using scatter data at one wavelength to predict scatter at a different wavelength from the same optical component. The economic advantages of avoiding scatter measurements at all wavelengths of interest are obvious; however, the subtleties involved in making accurate wavelength scaling predictions are not. The requirements of the vector perturbation theory that the optic be a clean, smooth, front surface reflector are not always easily met for all desired wavelengths and materials. Furthermore, the experiments themselves are not trivial because they often involve all the complexities of instrument comparison measurements. This paper presents data for one dimensional (grating like) and two dimensional (polished) reflectors at wavelengths of 1.06, .86, .63, and .49 microns. The results show excellent correlation for both cases.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John C. Stover, Jeff Rifkin, Daniel R. Cheever, Kelly H. Kirchner, Tod F. Schiff, "Comparison Of Wavelength Scaling Data To Experiment", Proc. SPIE 0967, Stray Light and Contamination in Optical Systems, (5 April 1989); doi: 10.1117/12.948089; https://doi.org/10.1117/12.948089
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