The design of vane structure on baffle surfaces is analyzed using the APART/PADE stray light software, and the ASAP optical analysis and stray light software. Vane structure is used to block direct propagation paths from the baffle walls to other objects in the system. The depth and angle of the vanes are variables that are evaluated for both a centrally obscured system and an unobscured eccentric pupil design. It is shown that under most scenarios the vane angle and vane depth are not significant parameters once the first order propagation path is blocked. The significance of a degraded diffuse baffle coating on the various systems is also analyzed. The reason for evaluating two different, but commonly used, sensor designs is to highlight that the results are system design dependent. Concerns of contamination of the optical elements by the vane coatings due to contamination shake off, abrasive launch conditions which create contamination particles, or particle blowoff are also evaluated. BRDF versus RMS roughness is tabulated alongside particle size distributions in order to weight the relative significance of the contamination LEVEL, as defined by MIL-STD 1246A on the various designs.