21 December 1988 Fano-Noise-Limited CCDs
Author Affiliations +
Abstract
Recent developments of scientific CCDs have produced sensors that achieve ultra low read noise performance (less than 2 electrons rms) and near perfect charge transfer efficiency (0.9999996) without the addition of a fat-zero. This progress has now made it possible to achieve Fano-noise-limited performance in the soft x-ray where the detector's energy resolution is primarily limited by the statistical variation in the charge generated by the interacting x-ray photon. In this paper, Fano-noise-limited test data is presented for two different CCD types and a CCD derived estimate of the Fano factor is determined. By evaluating ultra low-modulation images (less than 1 electron peak-to-peak) it is shown that the CCD's global CTE is now superior to its read noise floor. To capitalize on this capability CCD manufacturers are now focusing their attention on reducing the noise floor below the 1 electron level thereby matching the sensor's CTE performance. This improvement, if accomplished, will push Fano-noise-limited performance for the CCD into the extreme ultra-violet.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James Janesick, James Janesick, Tom Elliott, Tom Elliott, Richard Bredthauer, Richard Bredthauer, Charles Chandler, Charles Chandler, Barry Burke, Barry Burke, } "Fano-Noise-Limited CCDs", Proc. SPIE 0982, X-Ray Instrumentation in Astronomy II, (21 December 1988); doi: 10.1117/12.948704; https://doi.org/10.1117/12.948704
PROCEEDINGS
26 PAGES


SHARE
RELATED CONTENT

Readout ASIC for x-ray CCDs
Proceedings of SPIE (August 17 2005)
CCD focal plane imaging detector for the JET X instrument...
Proceedings of SPIE (September 30 1991)
Frame store PN-CCD detector for space applications
Proceedings of SPIE (February 02 2004)
A 1024 X 1024 CCD For Scientific Applications
Proceedings of SPIE (November 26 1989)

Back to Top