18 January 1989 Neutron, X-Ray Scattering And TEM Studies Of Ni-Ti Multilayers
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Abstract
Analysis of Ni-Ti multilayer neutron reflectors and supermirrors has been undertaken to identify the causes of the lower than expected observed scattering power and critical angle enhancement of Ni-Ti supermirrors. Results of these investigations have focused attention on cusp formation in the Ni-Ti bilayers as probable cause for the reduced neutron scattering power. Grazing angle x-ray and neutron scattering, wide angle neutron diffraction and analytical cross sectional TEM have been used in this investigation. The multilayers were produced by magnetron sputtering and ion-beam deposition on float glass substrates and silicon wafers.
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J. E. Keem, J. E. Keem, J. Wood, J. Wood, N. Grupido, N. Grupido, K. Hart, K. Hart, S. Nutt, S. Nutt, D. G. Reichel, D. G. Reichel, W. B. Yelon, W. B. Yelon, "Neutron, X-Ray Scattering And TEM Studies Of Ni-Ti Multilayers", Proc. SPIE 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides, (18 January 1989); doi: 10.1117/12.948745; https://doi.org/10.1117/12.948745
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