18 January 1989 Neutron, X-Ray Scattering And TEM Studies Of Ni-Ti Multilayers
Author Affiliations +
Analysis of Ni-Ti multilayer neutron reflectors and supermirrors has been undertaken to identify the causes of the lower than expected observed scattering power and critical angle enhancement of Ni-Ti supermirrors. Results of these investigations have focused attention on cusp formation in the Ni-Ti bilayers as probable cause for the reduced neutron scattering power. Grazing angle x-ray and neutron scattering, wide angle neutron diffraction and analytical cross sectional TEM have been used in this investigation. The multilayers were produced by magnetron sputtering and ion-beam deposition on float glass substrates and silicon wafers.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. E. Keem, J. E. Keem, J. Wood, J. Wood, N. Grupido, N. Grupido, K. Hart, K. Hart, S. Nutt, S. Nutt, D. G. Reichel, D. G. Reichel, W. B. Yelon, W. B. Yelon, "Neutron, X-Ray Scattering And TEM Studies Of Ni-Ti Multilayers", Proc. SPIE 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides, (18 January 1989); doi: 10.1117/12.948745; https://doi.org/10.1117/12.948745


Back to Top