Neutron reflectivity of Ni-Si multilayers

J. B. Al-Dabbagh; B. L. Evans

doi:10.1117/12.948763

18 January 1989 Neutron reflectivity of Ni-Si multilayers

J. B. Al-Dabbagh, B. L. Evans

Proceedings Volume 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides; (1989) https://doi.org/10.1117/12.948763
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

The neutron reflectivity spectra of multilayers has been measured as a function of angle of incidence and neutron wavelength in the range 1-7Å. The measurements are discussed in terms of the fabrication method employed and compared with the corresponding X-ray reflectivity spectra.

Citation Download Citation

J. B. Al-Dabbagh and B. L. Evans "Neutron reflectivity of Ni-Si multilayers", Proc. SPIE 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides, (18 January 1989); https://doi.org/10.1117/12.948763

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