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Abstract
The neutron reflectivity spectra of multilayers has been measured as a function of angle of incidence and neutron wavelength in the range 1-7Å. The measurements are discussed in terms of the fabrication method employed and compared with the corresponding X-ray reflectivity spectra.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. B. Al-Dabbagh and B. L. Evans "Neutron reflectivity of Ni-Si multilayers", Proc. SPIE 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides, (18 January 1989); https://doi.org/10.1117/12.948763
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