PROCEEDINGS VOLUME 0984
32ND ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 15-18 AUGUST 1988
X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers
IN THIS VOLUME

1 Sessions, 33 Papers, 0 Presentations
All Papers  (33)
32ND ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
15-18 August 1988
San Diego, CA, United States
All Papers
Proc. SPIE 0984, Common Aspects And Basic Differences Of Optical Devices For X-Ray And Neutron Scattering, 0000 (16 December 1988); doi: 10.1117/12.948764
Proc. SPIE 0984, Soft X-Ray Monochromators For Synchrotron Radiation, 0000 (16 December 1988); doi: 10.1117/12.948765
Proc. SPIE 0984, Application Of W/Si Multilayers For Monochromatization Of Soft X-Ray Synchrotron Radiation, 0000 (16 December 1988); doi: 10.1117/12.948766
Proc. SPIE 0984, A Monochromator Based On WIC Multilayers Of 40A Layer Spacing, 0000 (16 December 1988); doi: 10.1117/12.948767
Proc. SPIE 0984, Theory Of Multilayer Neutron Monochromators, 0000 (16 December 1988); doi: 10.1117/12.948768
Proc. SPIE 0984, Neutron Reflectivity Of Ni-Si Multilayers, 0000 (16 December 1988); doi: 10.1117/12.948769
Proc. SPIE 0984, Multilayer X-Ray Mirrors; The State Of The Art., 0000 (16 December 1988); doi: 10.1117/12.948770
Proc. SPIE 0984, Manufacture, Structure And Performance Of W/B4C Multilayer X-Ray Mirrors, 0000 (16 December 1988); doi: 10.1117/12.948771
Proc. SPIE 0984, Molecular Beam Epitaxy For Multilayer Fabrication, 0000 (16 December 1988); doi: 10.1117/12.948772
Proc. SPIE 0984, Multilayer Characterization At LPARL, 0000 (16 December 1988); doi: 10.1117/12.948773
Proc. SPIE 0984, Tests Of Short Period X-Ray Multilayer Mirrors Using A Position Sensitive Proportional Counter, 0000 (16 December 1988); doi: 10.1117/12.948774
Proc. SPIE 0984, Analysis Of The Smoothing Process Observed During The Soft X-Ray Multilayer Deposition, 0000 (16 December 1988); doi: 10.1117/12.948775
Proc. SPIE 0984, The Soft X-Ray To Euv Performance Of Plane And Concave Pt-Si Multilayer Mirrors, 0000 (16 December 1988); doi: 10.1117/12.948776
Proc. SPIE 0984, Layered synthetic multilayers for high resolution X-ray reflection in the 6 to 8 keV region., 0000 (16 December 1988); doi: 10.1117/12.948777
Proc. SPIE 0984, A New X-Ray Reflectometer, 0000 (16 December 1988); doi: 10.1117/12.948778
Proc. SPIE 0984, Overview Of Japanese Multilayer Research, 0000 (16 December 1988); doi: 10.1117/12.948779
Proc. SPIE 0984, Evaluation Of Alternative Mo-Si Multilayer For Soft X-Ray Mirrors By Electron Microscopy And X-Ray Diffraction, 0000 (16 December 1988); doi: 10.1117/12.948780
Proc. SPIE 0984, Comparison Among Multilayer Soft X-Ray Mirrors Fabricated By Electron Beam, Dc-, Rf-Magnetron Sputtering And Ion Beam Sputtering Deposition, 0000 (16 December 1988); doi: 10.1117/12.948781
Proc. SPIE 0984, The Modelling Of X-Ray Reflectivity From Ideal And Imperfect Multilayer Systems., 0000 (16 December 1988); doi: 10.1117/12.948782
Proc. SPIE 0984, Optimum Design Method Of Multilayer Elements, 0000 (16 December 1988); doi: 10.1117/12.948783
Proc. SPIE 0984, Matricial Formalism For Interfacial Roughness Analysis Of LSMs, 0000 (16 December 1988); doi: 10.1117/12.948784
Proc. SPIE 0984, Measurements Of X-Ray Surface Scattering And Diffraction Properties Of Selected Multilayers, 0000 (16 December 1988); doi: 10.1117/12.948785
Proc. SPIE 0984, Soft X-Ray Multilayers Produced By Sputtering And Molecular Beam Epitaxy (MBE): Substrate And Interfacial Roughness, 0000 (16 December 1988); doi: 10.1117/12.948786
Proc. SPIE 0984, Surface Roughness Healing Of Substrates For XUV Multi Layer Coatings, 0000 (16 December 1988); doi: 10.1117/12.948787
Proc. SPIE 0984, The Effects Of Surface Quality Upon The Performance Of Normal Incidence X-Ray/XUV Imaging Systems, 0000 (16 December 1988); doi: 10.1117/12.948788
Proc. SPIE 0984, Recent Results In Multilayer Research, 0000 (16 December 1988); doi: 10.1117/12.948789
Proc. SPIE 0984, Characterization Of Focusing Multilayer Mirrors For Use In Collection Of Carbon K Fluorescent Radiation, 0000 (16 December 1988); doi: 10.1117/12.948790
Proc. SPIE 0984, Multilayer Reflection Filters For Soft X-Rays, 0000 (16 December 1988); doi: 10.1117/12.948791
Proc. SPIE 0984, Design Of An Imaging Microscope For Soft X-Ray Applications, 0000 (16 December 1988); doi: 10.1117/12.948792
Proc. SPIE 0984, Sputtered-Sliced Multilayers: Zone Plates And Transmission Gratings For 8-kev X Rays, 0000 (16 December 1988); doi: 10.1117/12.948793
Proc. SPIE 0984, Assessment Of Multilayer Mirror For XUV Laser Use, 0000 (16 December 1988); doi: 10.1117/12.948794
Proc. SPIE 0984, Monolithic Fabry-Perot Structure For Soft X-Rays, 0000 (16 December 1988); doi: 10.1117/12.948795
Proc. SPIE 0984, Semitransparent Multilayer Mirrors In The Soft X-Ray Range, 0000 (16 December 1988); doi: 10.1117/12.948796
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