16 December 1988 Assessment Of Multilayer Mirror For XUV Laser Use
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Abstract
We here present a new, simple and experimentally unambiguous method of assessing the reflectivity of concave X-ray multilayer mirrors. Preliminary results indicating reflectivities ≈80% of the calculated value are shown for mirrors of 100mm radius of curvature fabricated for use in a 236Å XUV laser scheme.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M Grande, B L Evans, A M. H. Al Arab, N H Rizvi, Shi Xu, "Assessment Of Multilayer Mirror For XUV Laser Use", Proc. SPIE 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, (16 December 1988); doi: 10.1117/12.948794; https://doi.org/10.1117/12.948794
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KEYWORDS
Mirrors

Extreme ultraviolet

Reflectivity

Spectrometers

Plasma

Aluminum

Platinum

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