Translator Disclaimer
Paper
16 December 1988 Matricial Formalism For Interfacial Roughness Analysis Of LSMs
Author Affiliations +
Abstract
The matricial formalism is adopted to treat the influence of the interfacial roughness. It is shown that the matrix characterizing the interface is modified in such a way that the Fresnel reflection coefficient is decreased and the Fresnel transmission coefficient is en-hanced by appropriate factors. These coefficients are formally similar to the so-called Debye-Waller factor, but they take account of the effective wavenumber of each medium. It results that a rough interface is in a way, equivalent to a homogeneous transition layer. Examples of characterization using measurements performed at 0.154 nm are given.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. Pardo, L. Nevot, and J-M Andre "Matricial Formalism For Interfacial Roughness Analysis Of LSMs", Proc. SPIE 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, (16 December 1988); https://doi.org/10.1117/12.948784
PROCEEDINGS
8 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT


Back to Top