16 December 1988 The Modelling Of X-Ray Reflectivity From Ideal And Imperfect Multilayer Systems.
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Abstract
A review is presented of current theoretical topics relating to the modelling of X-reflectivity from multilayer structures. The topics comprise: (1) Fresnel theory and its limitations; (2) atomic plane iterated diffraction; (3) sinusoidal layering and optical Bloch waves; (4) imperfect layers.
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P. G. Harper, P. G. Harper, } "The Modelling Of X-Ray Reflectivity From Ideal And Imperfect Multilayer Systems.", Proc. SPIE 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, (16 December 1988); doi: 10.1117/12.948782; https://doi.org/10.1117/12.948782
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