16 December 1988 Laser-Induced Forward Transfer Of Metal Oxides To Trim The Frequency Of Surface Acoustic Wave Resonator Devices
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Proceedings Volume 0998, Excimer Beam Applications; (1988) https://doi.org/10.1117/12.960218
Event: O-E/Fiber LASE '88, 1988, Boston, MA, United States
Abstract
The frequencies of surface acoustic wave resonators (SAWRs) sealed in novel all quartz packages have been accurately set using laser-induced forward transfer (LIFT) of aluminum-oxide thin films. This technique allows accurate frequency adjustment of SAWRs over -40 parts per million (PPM) with a resolution of better than ±1 PPM. This technique does not significantly degrade relevant electrical SAWR device characteristics and provides the user with substantial cost and time savings when setting a SAWR oscillator to frequency. However, some degradation in the long-term stability of oscillators driven by laser-trimmed SAWR devices has been measured. The quality of the LIFT-deposited oxide film plays an important role in both the frequency sensitivity and long-term stability of laser-trimmed SAWR devices.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James A. Greer, James A. Greer, Thomas E. Parker, Thomas E. Parker, } "Laser-Induced Forward Transfer Of Metal Oxides To Trim The Frequency Of Surface Acoustic Wave Resonator Devices", Proc. SPIE 0998, Excimer Beam Applications, (16 December 1988); doi: 10.1117/12.960218; https://doi.org/10.1117/12.960218
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