14 December 2016 Universal system for the automation of test setups
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Proceedings Volume 10010, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VIII; 100100W (2016) https://doi.org/10.1117/12.2243244
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2016, 2016, Constanta, Romania
Abstract
This paper presents the concept of a universal control system for automation of small test setups. The main purpose is to control the environment in which the electronic component is being tested. The system has two device types: a master device and multiple slave devices. In this control system the devices are able to communicate with each other and are able to monitor and control specific tasks or actions required in the test flow. The system can be configured using a computer application based on text input.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexandru Buturuga, Alexandru Buturuga, Rodica Constantinescu, Rodica Constantinescu, Dan Stoichescu, Dan Stoichescu, } "Universal system for the automation of test setups", Proc. SPIE 10010, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VIII, 100100W (14 December 2016); doi: 10.1117/12.2243244; https://doi.org/10.1117/12.2243244
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