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14 December 2016 Numerical system for monitoring pressurized equipment
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Proceedings Volume 10010, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VIII; 100102V (2016)
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2016, 2016, Constanta, Romania
Electrical devices for operation in potentially explosive atmospheres are designed and built in accordance with European standard EN 50015: 1995 ex. the pressurized enclosure "p". The type of protector p, by using a protective gas in the housing is intended to prevent the formation of an explosive atmosphere within it, while maintaining an overpressure to the surrounding atmosphere and, where appropriate, by the use dilution. Research conducted for pressurized encapsulation aimed at developing new procedures for determining the parameters of pressurization to allow safe use of electrical appliances.

Pressurization with compensation for losses allegedly maintaining overpressure inside the enclosure when the outlets are closed, is made by feeding protective gas in an amount sufficient to fully compensate for losses from the housing inevitable pressurized and its associated pipework. The conditions and necessary measures that are required for appliances and equipment with potential ignition of explosive atmospheres are detailed in the SR EN 50016/2000. For pressurized encapsulation protection mode, the electric equipment can be maintained safety by the overpressure created inside them and in the supply pipes with air.

The paper presents a modern method to determine the parameters of the electric equipment with pressurization enclosures. For controlling of such equipment, a specific algorithm has been developed and laboratory tested.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Remus Dobra, Dragos Pasculescu, Maria Loredana Boca, and Lucian Moldovan "Numerical system for monitoring pressurized equipment", Proc. SPIE 10010, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VIII, 100102V (14 December 2016);


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