24 November 2016 The total spectral radiant flux calibration using a spherical spectrometer at National Institute of Metrology China
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Abstract
At present day, in the field of lighting the incandescent lamps are phasing out. The solid state lighting products, i.e. LED, and the related market are developing very fast in China for its promising application, due to the energy-saving and the colorful features. For the quality control and the commercial trade purpose, it is highly necessary to measure the optical parameters of LED light sources with a fast, easy and affordable facility. Therefore, more test labs use the spherical spectrometer to measure LED. The quasi- monochrome of LED and the V(lambda) of silicon photodetector mismatch problem is reduced or avoided, because the total spectral radiant flux (TSRF) is measured, and all the optical parameters are calculate from the TSRF. In such a way, the spherical spectrometer calibration requires TSRF standard lamps instead of the traditional total flux standard lamps. National Institute of Metrology China (NIM) has studied and developed the facilities for TSRF measurement and provides related calibration services. This paper shows the TSRF standard lamp calibration procedure using a spherical spectrometer in every-day calibration and its traceable link to the primary SI unit at NIM. The sphere is of 1.5 m diameter, and installed with a spectrometer and a silicon photodetector. It also shows the detail of data process, such as the spectral absorption correction method and the calculation of the result derived from the spectral readings. The TSRF calibration covers the spectra range of 350 nm to 1050 nm, with a measurement uncertainty of 3.6% ~ 1.8% (k=2).
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Weiqiang Zhao, Weiqiang Zhao, Hui Liu, Hui Liu, Jian Liu, Jian Liu, } "The total spectral radiant flux calibration using a spherical spectrometer at National Institute of Metrology China", Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100230Q (24 November 2016); doi: 10.1117/12.2245571; https://doi.org/10.1117/12.2245571
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