Abstract
Structured light measurement has been wildly used since 1970s in industrial component detection, reverse engineering, 3D molding, robot navigation, medical and many other fields. In order to satisfy the demand for high speed, high precision and high resolution 3-D measurement for embedded system, a new patterns combining binary and gray coding principle in space are designed and projected onto the object surface orderly. Each pixel corresponds to the designed sequence of gray values in time – domain, which is treated as a feature vector. The unique gray vector is then dimensionally reduced to a scalar which could be used as characteristic information for binocular matching. In this method, the number of projected structured light patterns is reduced, and the time-consuming phase unwrapping in traditional phase shift methods is avoided. This algorithm is eventually implemented on DM3730 embedded system for 3-D measuring, which consists of an ARM and a DSP core and has a strong capability of digital signal processing. Experimental results demonstrated the feasibility of the proposed method.
