3 November 2016 TDDA technology for high spatial resolution SWIR InGaAs imaging
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With the development of remote sensing technology, shortwave infrared (SWIR) imaging technology has got more and more attention because of its ability through the fog and high spatial resolution. High spatial resolution SWIR imaging often requires high frame frequency. If the frame frequency is too high, it could cause the shortage of the image’s signal to noise ratio (SNR), seriously affecting image quality. In order to solve the contradiction between high spatial resolution and sensitivity, time delay and digital accumulation (TDDA) technology is proposed in this paper to improve system’s SNR and image quality. A prototype of SWIR imaging system based on a large format area InGaAs detector is designed, which demonstrates TDDA technology. The experiment results indicate that TDDA technology can increase system’s SNR of the square root of accumulative stage and improve image’s uniformity. The results in this paper are helpful for the improvement and application of high spatial resolution SWIR imaging technology.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jianxin Jia, Jianxin Jia, Yueming Wang, Yueming Wang, Xiaoqiong Zhuang, Xiaoqiong Zhuang, Yi Yao, Yi Yao, Shengwei Wang, Shengwei Wang, Ding Zhao, Ding Zhao, Rong Shu, Rong Shu, Jianyu Wang, Jianyu Wang, } "TDDA technology for high spatial resolution SWIR InGaAs imaging", Proc. SPIE 10030, Infrared, Millimeter-Wave, and Terahertz Technologies IV, 1003012 (3 November 2016); doi: 10.1117/12.2245127; https://doi.org/10.1117/12.2245127


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