28 September 2016 A novel method of measurement of LC circuits Q-factor
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Proceedings Volume 10031, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016; 1003129 (2016) https://doi.org/10.1117/12.2249234
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016, 2016, Wilga, Poland
Abstract
This paper presents a new method of measurement of quality factor of inductors and resonance circuits with usage of the effect of the formation of oscillations in sine wave oscillator. The article presents two different hardware realizations for parallel and series LC resonators.
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Michał Kalisiak, Aleksander Burd, "A novel method of measurement of LC circuits Q-factor", Proc. SPIE 10031, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016, 1003129 (28 September 2016); doi: 10.1117/12.2249234; https://doi.org/10.1117/12.2249234
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