21 March 1989 Use Of Surface Enhanced Raman Scattering To Characterize Metal Substrate
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Proceedings Volume 1009, Surface Measurement and Characterization; (1989) https://doi.org/10.1117/12.949182
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
It is proposed that surface enhanced Raman scattering (SERS) of a monolayer of a dye deposited on a rough metal surface can be used to characterize the film roughness. The advantage of these techniques is the use of a very sensitive methods (Raman scattering signal) to measure microscopic roughness in metal substrate. The Raman enhancement is due to the amplification by the Ag core of the electric field associated with the driven modes of the dye layer. In the present case the due is crystal violet (CV) and the measured enhancements are calculated to be of the order of 104 to 106. Since, the enhancement of the Raman spectra depends on the structure of the metal island film and specially the roughness, this effect can be applied to investigate the surface roughness of the substrate and characterize its structure.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kamel M. El-Shokrofy, Sohair Negm, H. Talaat, "Use Of Surface Enhanced Raman Scattering To Characterize Metal Substrate", Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); doi: 10.1117/12.949182; https://doi.org/10.1117/12.949182
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