Visual Assessment And Instrumental Quantification Of Optical Surfaces And Thin Film Coatings Relative To Their Roughness And Light Scattering

Karl H. Guenther

doi:10.1117/12.949175

21 March 1989 Visual Assessment And Instrumental Quantification Of Optical Surfaces And Thin Film Coatings Relative To Their Roughness And Light Scattering

Karl H. Guenther

Author Affiliations +

Proceedings Volume 1009, Surface Measurement and Characterization; (1989) https://doi.org/10.1117/12.949175
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany

Abstract

Quasi-calibrated, easy-to-use visual methods for assessing the roughness (or smoothness) of optical surfaces and thin film coatings in the optical shop are investigated as to their correlation with instrumental surface roughness measurement methods. An intriguing relation between visual relative ranking of optical surfaces with the aid of a Nomarski microscope and the fractal dimension of their scattered light field is described in some detail.

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Karl H. Guenther "Visual Assessment And Instrumental Quantification Of Optical Surfaces And Thin Film Coatings Relative To Their Roughness And Light Scattering", Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); https://doi.org/10.1117/12.949175

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