21 March 1989 Visual Assessment And Instrumental Quantification Of Optical Surfaces And Thin Film Coatings Relative To Their Roughness And Light Scattering
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Proceedings Volume 1009, Surface Measurement and Characterization; (1989) https://doi.org/10.1117/12.949175
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
Quasi-calibrated, easy-to-use visual methods for assessing the roughness (or smoothness) of optical surfaces and thin film coatings in the optical shop are investigated as to their correlation with instrumental surface roughness measurement methods. An intriguing relation between visual relative ranking of optical surfaces with the aid of a Nomarski microscope and the fractal dimension of their scattered light field is described in some detail.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karl H. Guenther, Karl H. Guenther, } "Visual Assessment And Instrumental Quantification Of Optical Surfaces And Thin Film Coatings Relative To Their Roughness And Light Scattering", Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); doi: 10.1117/12.949175; https://doi.org/10.1117/12.949175
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