Presentation
21 April 2017 Ultrafast dynamics and stabilization in chip-scale optical frequency combs (Conference Presentation)
Author Affiliations +
Abstract
Optical frequency comb technology has been the cornerstone for scientific breakthroughs such as precision frequency metrology, re-definition of time, extreme light-matter interaction, and attosecond sciences. Recently emerged Kerr-active microresonators are promising alternatives to the current benchmark femtosecond laser platform. These chip-scale frequency combs, or Kerr combs, are unique in their compact footprints and offer the potential for monolithic electronic and feedback integration, thereby expanding the already remarkable applications of optical frequency combs.

In this talk, I will first report the generation and characterization of low-phase-noise Kerr frequency combs. Measurements of the Kerr comb ultrafast dynamics and phase noise will be presented and discussed. Then I will describe novel strategies to fully stabilize Kerr comb line frequencies towards chip-scale optical frequency synthesizers with a relative uncertainty better than 2.7×10-16. I will show that the unique generation physics of Kerr frequency comb can provide an intrinsic self-referenced access to the Kerr comb line frequencies. The strategy improves the optical frequency stability by more than two orders of magnitude, while preserving the Kerr comb’s key advantage of low SWaP and potential for chip-scale electronic and photonic integration.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shu Wei Huang "Ultrafast dynamics and stabilization in chip-scale optical frequency combs (Conference Presentation)", Proc. SPIE 10090, Laser Resonators, Microresonators, and Beam Control XIX, 1009009 (21 April 2017); https://doi.org/10.1117/12.2251204
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KEYWORDS
Frequency combs

Integrated optics

Ultrafast phenomena

Microresonators

Ultrafast measurement systems

Femtosecond phenomena

Frequency metrology

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