16 February 2017 CMOS SiPM with integrated amplifier
Author Affiliations +
Proceedings Volume 10100, Optical Components and Materials XIV; 101001A (2017) https://doi.org/10.1117/12.2252516
Event: SPIE OPTO, 2017, San Francisco, California, United States
Abstract
The integration of silicon photomultiplier (SiPM) and frontend electronics in a suitable optoelectronic CMOS process is a promising approach to increase the versatility of single-photon avalanche diode (SPAD)-based singlephoton detectors. By integrating readout amplifiers, the device output capacitance can be reduced to minimize the waveform tail, which is especially important for large area detectors (>10 × 10mm2). Possible architectures include a single readout amplifier for the whole detector, which reduces the output capacitance to 1:1 pF at minimal reduction in detector active area. On the other hand, including a readout amplifier in every SiPM cell would greatly improve the total output capacitance by minimizing the influence of metal routing parasitic capacitance, but requiring a prohibitive amount of detector area. As tradeoff, the proposed detector features one readout amplifier for each column of the detector matrix to allow for a moderate reduction in output capacitance while allowing the electronics to be placed in the periphery of the active detector area. The presented detector with a total size of 1.7 ♦ 1.0mm2 features 400 cells with a 50 μm pitch, where the signal of each column of 20 SiPM cells is summed in a readout channel. The 20 readout channels are subsequently summed into one output channel, to allow the device to be used as a drop-in replacement for commonly used analog SiPMs.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Schwinger, Alexander Schwinger, Werner Brockherde, Werner Brockherde, Bedrich J. Hosticka, Bedrich J. Hosticka, Holger Vogt, Holger Vogt, } "CMOS SiPM with integrated amplifier", Proc. SPIE 10100, Optical Components and Materials XIV, 101001A (16 February 2017); doi: 10.1117/12.2252516; https://doi.org/10.1117/12.2252516
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