20 February 2017 Future of high-speed short-reach interconnects using clad-dielectric waveguide
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Proceedings Volume 10109, Optical Interconnects XVII; 1010903 (2017) https://doi.org/10.1117/12.2249252
Event: SPIE OPTO, 2017, San Francisco, California, United States
The ever-increasing demand for bandwidth requires advanced interconnect solutions satisfying functional and economic constraints. A new interconnect called electrical tube (E-TUBE) is proposed as a cost-and-power-effective all-electricaldomain wideband waveguide solution for high-speed, high-volume, and short-reach communication links. Unlike conventional optical solutions, the E-TUBE achieves state-of-the-art performance in terms of bandwidth-per-carrier frequency, power, and density without any precision manufacturing process. The E-TUBE exhibits a frequencyindependent loss-profile and has 20GHz bandwidth over the V band. The inherent frequency response of the E-TUBE enables a single-sideband signal transmission and renders double data throughput without any physical overhead. Transmission up to 14Gb/s signals over 1.2m has been tested using 73GHz carrier frequency (fC). The IC is fabricated in 40nm CMOS and the figure-of-merit of the interface is 0.52J/b/m×*fC (Radio frequency circuits only: 0.3J/b/m×*fC).
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Y. Lee, J. Y. Lee, H. I. Song, H. I. Song, S. W. Kwon, S. W. Kwon, H. M. Bae, H. M. Bae, } "Future of high-speed short-reach interconnects using clad-dielectric waveguide", Proc. SPIE 10109, Optical Interconnects XVII, 1010903 (20 February 2017); doi: 10.1117/12.2249252; https://doi.org/10.1117/12.2249252


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