20 February 2017 Insertion loss study for panel-level single-mode glass waveguides
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Proceedings Volume 10109, Optical Interconnects XVII; 101090J (2017) https://doi.org/10.1117/12.2252802
Event: SPIE OPTO, 2017, San Francisco, California, United States
The paper compares the results of panel- and wafer-level processing of display glass integrated single mode optical waveguides. The comparison is based on measurements of the same optical structures processed using panel- and waferlevel technology. Additionally, large panels of 440 mm x 305 mm where manufactured to prove the scalability of the single-mode process. Measurements are done by optical back scattering reflectometry using a Luna OBR 4600 and a fiber-based propagation loss measurement setup. Based on these results of diverse processing equipment and substrate dimensions, a comprehensive statistic is shown and error estimation made to compare the different technologies.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Neitz, M. Neitz, J. Röder-Ali, J. Röder-Ali, S. Marx, S. Marx, C. Herbst, C. Herbst, C. Frey, C. Frey, H. Schröder, H. Schröder, K.-D. Lang, K.-D. Lang, } "Insertion loss study for panel-level single-mode glass waveguides", Proc. SPIE 10109, Optical Interconnects XVII, 101090J (20 February 2017); doi: 10.1117/12.2252802; https://doi.org/10.1117/12.2252802


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