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20 February 2017 Highly sensitive measurement of submicron waveguides based on Brillouin scattering
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Proceedings Volume 10110, Photonic Instrumentation Engineering IV; 1011009 (2017)
Event: SPIE OPTO, 2017, San Francisco, California, United States
Fabrication and characterization of submicron optical waveguides is one of the major challenges in modern photonics, as they find many applications from optical sensors to plasmonic devices. Here we report on a novel technique that allows for a complete and precise characterization of silica optical nanofibers. Our method relies on the Brillouin backscattering spectrum analysis that directly depends on the waveguide geometry. Our method was applied to several fiber tapers with diameter ranging from 500 nm to 3 μm. Results were compared to scanning electron microscopy (SEM) images and numerical simulations with very good agreement and similar sensitivity.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Adrien Godet, Abdoulaye Ndao, Thibaut Sylvestre, Jean-Charles Beugnot, and Kien Phan Huy "Highly sensitive measurement of submicron waveguides based on Brillouin scattering", Proc. SPIE 10110, Photonic Instrumentation Engineering IV, 1011009 (20 February 2017);


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