Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress

Carlo De Santi; Matteo Meneghini; Nicola Renso; Matteo Buffolo; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Andrea Migliori; Vittorio Morandi; Gaudenzio Meneghesso; Enrico Zanoni

doi:10.1117/12.2256023

16 February 2017 Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress

Carlo De Santi, Matteo Meneghini, Nicola Renso, Matteo Buffolo, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Andrea Migliori, Vittorio Morandi, Gaudenzio Meneghesso, Enrico Zanoni

Author Affiliations +

Proceedings Volume 10124, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXI; 101240F (2017) https://doi.org/10.1117/12.2256023
Event: SPIE OPTO, 2017, San Francisco, California, United States

Abstract

This paper demonstrates that when InGaN LEDs are submitted to a constant reverse bias, they can show a time-dependent breakdown, that leads to the catastrophic failure of the devices. By submitting green and blue LEDs to constant voltage stress in the range between -40 V and -60 V we demonstrate that: (i) under reverse bias conditions, current is focused on localized paths, whose positions can be identified by electroluminescence measurements, and that originate from the presence of extended defects; (ii) during a constant voltage stress, the reverse current of the LEDs gradually increases; (iii) for longer stress times, all devices show a time-dependent breakdown; (iv) time-to-failure has an exponential dependence on stress voltage, and is Weibull-distributed.

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Carlo De Santi, Matteo Meneghini, Nicola Renso, Matteo Buffolo, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Andrea Migliori, Vittorio Morandi, Gaudenzio Meneghesso, and Enrico Zanoni "Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress", Proc. SPIE 10124, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXI, 101240F (16 February 2017); https://doi.org/10.1117/12.2256023

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