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16 February 2017 New generation of Fourier optics viewing angle measurement systems
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Proceedings Volume 10126, Advances in Display Technologies VII; 1012604 (2017)
Event: SPIE OPTO, 2017, San Francisco, California, United States
We explain the technical bases of the Fourier Optics Technology (OFT) for viewing angle measurement of displays and the increasing capacities of the ELDIM systems over the years. A new generation of OFT systems devoted to quality control is introduced. In spite of a more compact size, the optic shows excellent performances in terms of angular aperture, angular resolution and collection efficiency. The detection is made with a new generation high resolution CMOS camera which allows very short measurement times. In addition, the probe can be used on a robotic arm to offer a cost effective solution for quality control of displays with any kind of size and shape.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre Boher, Thierry Leroux, Vincent Leroux, Thibault Bignon, and Véronique Collomb-Patton "New generation of Fourier optics viewing angle measurement systems", Proc. SPIE 10126, Advances in Display Technologies VII, 1012604 (16 February 2017);

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