5 April 1989 Calculated And Measured Refractive Index Profiles Of K+-Exchanged Glass-Waveguides
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Proceedings Volume 1014, Micro-Optics; (1989) https://doi.org/10.1117/12.949436
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
K+-exchanged film and stripe waveguides have been fabricated. The diffusion time varied between one and 16 hours. m-line spectroscopy was used to characterize the waveguides. The refractive index profile of those waveguides is proportional to a concentration profile calculated under the assumption that the number of indiffused ions is limited by the glass network to a constant value at the surface. From those profiles derived n eff-values and near-fields compare well with the measurements in a wide range of strip widths and diffusion times. The waveguides can be described by four parameters: a constant ∆ N, the stripe width, the diffusion time and the diffusion coefficient.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karl Spenner, Albrecht Brandenburg, Wulf Lotze, "Calculated And Measured Refractive Index Profiles Of K+-Exchanged Glass-Waveguides", Proc. SPIE 1014, Micro-Optics, (5 April 1989); doi: 10.1117/12.949436; https://doi.org/10.1117/12.949436
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