Qualification of a 3D structured light sensor for a reverse engineering application

Alexandre Z. Guarato; Alexandre C. Loja; Leonardo P. Pereira; Sergio L. Braga; Thales R. B. Trevilato

doi:10.1117/12.2257601

11 November 2016 Qualification of a 3D structured light sensor for a reverse engineering application

Alexandre Z. Guarato, Alexandre C. Loja, Leonardo P. Pereira, Sergio L. Braga, Thales R. B. Trevilato

Author Affiliations +

Proceedings Volume 10151, Optics and Measurement International Conference 2016; 101510C (2016) https://doi.org/10.1117/12.2257601
Event: Optics and Measurement 2016 International Conference, 2016, Liberec, Czech Republic

Abstract

This paper deals with the qualification of a 3D structured light scanning system for an application of reverse engineering of a mechanical part. As this white light scanner is an electro-optical device and based on the principle of optical triangulation, the measurement accuracy is affected by the measured part geometry and its position within the scanning window. The effects of the scan depth and the projected angle, characterizing the surface normal of the measured surface to the scanning point of view, on the measurement of accuracy are not considered in the standard calibration process of manufacturers and have been identified by experiments in the present work. The digitization errors are analyzed and characterized thanks to a measurement protocol based on quality indicators. Theses quality indicators are evaluated thanks to simple calibrated artifacts. The aim of this work is to redefine the ideal relative distance and relative angle for minimizing the digitizing errors in relation to those stated by the manufacturer for a reverse engineering application.

Citation Download Citation

Alexandre Z. Guarato, Alexandre Z. Guarato, Alexandre C. Loja, Alexandre C. Loja, Leonardo P. Pereira, Leonardo P. Pereira, Sergio L. Braga, Sergio L. Braga, Thales R. B. Trevilato, Thales R. B. Trevilato, } "Qualification of a 3D structured light sensor for a reverse engineering application", Proc. SPIE 10151, Optics and Measurement International Conference 2016, 101510C (11 November 2016); doi: 10.1117/12.2257601; https://doi.org/10.1117/12.2257601

ACCESS THE FULL ARTICLE

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $14.40

Non-members: $18.00 ADD TO CART

Show All Keywords

Keywords/Phrases

Search In:

Publication Years