19 October 2016 Objective backscattering properties measurements at 2.52 terahertz
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Proceedings Volume 10153, Advanced Laser Manufacturing Technology; 101530O (2016) https://doi.org/10.1117/12.2246609
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China
Abstract
We present a system to measure objective backscattering properties at 2.52 terahertz (THz). The optical setup combining 90° off-axis parabolic mirrors with 15° off-axis parabolic mirror decreases the size of the system and then realizes its compact structure. The calibration object, a conducting sphere with a diameter of 50 mm, was introduced to eliminate the influence of the instability of THz radiation and the background noise on measurement results. The lock-in amplifier was adopted to enhance the signal-to-noise ratio (SNR) and then make it possible to observe delicate backscattering behaviors on the surface of the object. Backscattering properties of four scale models were measured in this paper. Experimental results indicate that the maximal error of our system is less than 1 dB, paving the way for practical measurements of objective backscattering properties at THz frequencies.
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Qi Li, Qi Li, Yi Zhou, Yi Zhou, Qian Li, Qian Li, Chang-Kun Fan, Chang-Kun Fan, Yong-Peng Zhao, Yong-Peng Zhao, De-Ying Chen, De-Ying Chen, } "Objective backscattering properties measurements at 2.52 terahertz", Proc. SPIE 10153, Advanced Laser Manufacturing Technology, 101530O (19 October 2016); doi: 10.1117/12.2246609; https://doi.org/10.1117/12.2246609
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