19 October 2016 Failure analysis and preventive measures of light-emitting diode
Author Affiliations +
Proceedings Volume 10154, Advanced Optical Design and Manufacturing Technology and Astronomical Telescopes and Instrumentation; 101541A (2016) https://doi.org/10.1117/12.2246747
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China
Abstract
In order to study the effect of light-emitting diode reliability made by electrical overstress, in this paper, the LF3R light-emitting diode is taken as an example, the basic failure model of diode is set up and the main factors affecting the performance and reliability of light-emitting diode are given, then the measures to prevent failures of light-emitting diode are given, which is of guide significance to the proper use of light-emitting diode. The test results show that the modeling of LF3R reflects its failure regularity and is applicable in practice.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhong-Shu Yang, "Failure analysis and preventive measures of light-emitting diode", Proc. SPIE 10154, Advanced Optical Design and Manufacturing Technology and Astronomical Telescopes and Instrumentation, 101541A (19 October 2016); doi: 10.1117/12.2246747; https://doi.org/10.1117/12.2246747
PROCEEDINGS
6 PAGES


SHARE
Back to Top