19 October 2016 A focal plane metrology system and PSF centroiding experiment
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Proceedings Volume 10155, Optical Measurement Technology and Instrumentation; 101550S (2016) https://doi.org/10.1117/12.2244938
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China
Abstract
In this paper, we present an overview of a detector array equipment metrology testbed and a micro-pixel centroiding experiment currently under development at the National Space Science Center, Chinese Academy of Sciences. We discuss on-going development efforts aimed at calibrating the intra-/inter-pixel quantum efficiency and pixel positions for scientific grade CMOS detector, and review significant progress in achieving higher precision differential centroiding for pseudo star images in large area back-illuminated CMOS detector. Without calibration of pixel positions and intrapixel response, we have demonstrated that the standard deviation of differential centroiding is below 2.0e-3 pixels.
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Haitao Li, Baoquan Li, Yang Cao, Ligang Li, "A focal plane metrology system and PSF centroiding experiment", Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550S (19 October 2016); doi: 10.1117/12.2244938; https://doi.org/10.1117/12.2244938
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