19 October 2016 A focal plane metrology system and PSF centroiding experiment
Author Affiliations +
Proceedings Volume 10155, Optical Measurement Technology and Instrumentation; 101550S (2016) https://doi.org/10.1117/12.2244938
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China
In this paper, we present an overview of a detector array equipment metrology testbed and a micro-pixel centroiding experiment currently under development at the National Space Science Center, Chinese Academy of Sciences. We discuss on-going development efforts aimed at calibrating the intra-/inter-pixel quantum efficiency and pixel positions for scientific grade CMOS detector, and review significant progress in achieving higher precision differential centroiding for pseudo star images in large area back-illuminated CMOS detector. Without calibration of pixel positions and intrapixel response, we have demonstrated that the standard deviation of differential centroiding is below 2.0e-3 pixels.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haitao Li, Baoquan Li, Yang Cao, Ligang Li, "A focal plane metrology system and PSF centroiding experiment", Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550S (19 October 2016); doi: 10.1117/12.2244938; https://doi.org/10.1117/12.2244938

Back to Top