19 October 2016 Research on method and device of non-disperse atomic fluorescence excitation light source impurity detection
Author Affiliations +
Proceedings Volume 10155, Optical Measurement Technology and Instrumentation; 101550W (2016) https://doi.org/10.1117/12.2245022
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China
Abstract
Analysis on the impurities of non-dispersive atomic fluorescence exciting light source is given. A method is proposed to detect this kind of light source impurity by using spectral analysis, and a set of light source detection standard device was accomplished. Corresponding algorithm and application software were developed. The detection wavelength range of the device is 190~350 nm, the maximum allowable error is ±0.3 nm. The device achieved fast detection of the excitation light source impurity and could be verified by the experimental results.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yaqing Jia, Hong Wu, Zhengsheng Shen, "Research on method and device of non-disperse atomic fluorescence excitation light source impurity detection", Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550W (19 October 2016); doi: 10.1117/12.2245022; https://doi.org/10.1117/12.2245022
PROCEEDINGS
10 PAGES


SHARE
Back to Top